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Popular in Belief. Denzhu Marcu. Aaron Thompson. Anonymous KzCCQo. Racial Equity, Diversity and Inclusion. Marija Trninkova. Bayu Rahmansyah. Aman Sharma. Un, General Motors Corp, G. Matthews, Parker-Hanrifin A. McClure, Moore Too! Parsons, Federal Products Corp, E. Schneider deceased 'S. Scott Texas instruments A. Smythe, Zyg0 Corp. LD General.. Recommendation Scope of Section 4 Definitions and General Specifications Surface Characteristics Truncated Pyramid Tip 7 34 Aliasing Bite Cl Schmaltz Profile Microscope Average Spacing of Roughness Peaks This Standard is concerned with the geometric irregularities of surfaces.
This Standard is not concerned with error of form and flaws, but discusses these two factors to distinguish them from surface texture. They are included for clarification and in- formation purposes only.
Surface texture designations as delineated in this Standard may not provide a sufficient set of indexes for describing performance.
Other characteristics of engineering components such as dimensional and ge- cometrical characteristics, material. References to other useful works are included as footnotes. The real surface differs from the nominal surface to the extent that it exhibits surface texture, flaws, and errors of form. It is considered as the linear superposition of roughness, waviness, and form with the addition of flaws.
These might be characteristic marks left by the processes listed in Fig. BI of Appendix B. Roughness may be considered as superimposed on a wavy surface, lay — the predominant direction of the surface pat- tem, ordinarily determined by the production method used surface texture — the composite of certain devia- tions that are typical of the real surface.
It includes roughness and waviness. The term is applied to de- viations caused by such factors as errors in machine tool ways, guides, or spindles, insecure clamping or incorrect alignment of the workpiece, or uneven wear.
Out-of-fatness and out-of-roundness? However, these topographical interruptions are considered to be flaws only when agreed upon in advance by buyer and seller. If flaws are specified, the surface should be inspected by some mutually agreed upon method to determine whether flaws are present anc are to be.
If specified laws are not present, or if flaws are not specified, then interrup- tions in the surface topography of an engineering Component may be included in roughness measure- ments. ASME B4b. By previous definition see para. Roughness can thus be distinguished from waviness in terms of spatial wavelengths along the path traced. See para. No unique spatial wavelength is defined that would distinguish roughness from wav- iness for all surfaces.
In displays of surface profiles generated by instruments, height deviations from the geometric profile are usually magnified many times more than distances along the geometric profile see Fig. The sharp peaks and valleys and the steep slopes seen on such profile represen- tations of surfaces are thus greatly distoned images of the relatively gentle slopes characteristic of actual measured profiles.
The mean fine may bbe determined in several ways as discussed below. Reasoa, Modern Workshop Tecnology, 2 — Processes. Baker, ef, ed cation London: Macilian, , Chap. The difference between them is the roughness profile shown in Fig. This is a key specifi- cation for a measuring instrument. Ths is a key specification for a measuring instrument. This is a key specification for a measuring instrument. This is different from the evaluation length and the traversing length see para.
The range of sampling lengths is a key specification for a measuring instrument. The roughness sampling length may be determined by electrical analog filtering, dig ital filtering, or geometrical runcation of the profile into the appropriace lengths.
See waviness long-wavelength cutoff and waviness evaiuation length defined in Section 9. It should be equal tothe roughness long-wavelength cutoff. For proper statistics it should contain number of sam- pling lengths see Fig. However, for certain types of instruments or certain measurements, the evaluation See also Sections 4 and 9 and Appendix A. Because of end effects in profile measurements, the traversing length must be longer than the evaluation length see Fig.
Various mathematical combinations of sur- face profile heights and spacings have been devised to compare certain features of profiles numerically. Height parameters are expressed in micrometers am? A micrometer i one elon of « meter 0.
For writen specifications or reference to surface roughness requirmiets. For cigital instruments, the profile Z x is approximated by 2 set of digitized values Z re- corded using the sampling interval d,. As shown in Fig. For graphical de- terminations of roughness, the measured normal to the chart center line. Ry — the distance between the highest point of the Profile and the mean line within a sampling length segment labelled i See Fig. This parameter is the same 25 Ryq DIN when there are five sampling lengths within an evaluation length.
This parameter is the same as R DINY when there are five sampling lengths within an evaluation length, maximum roughness depth, Rng — the largest of the successive values of R, calculated over the evalua- tion length, In the DIN Standard , the evaluation Jength consists of five sampling lengths? Fig — a height parameter defined in terms of bearing, length ratios See para. The measurement is t0 be taken normal t0 the nominal profile within the limits of the waviness evaluation length.
Not for resale. The boundary lines are located par- allel to and equidistant from the profile mean line Gee Fig. P, — the number of SAE peaks per unit length measured at a specified peak count level 1. The level p may be specified in several ways including: Das a depth from the highest peak with an op- tional offset : 2 as a height from the mean line; or 3 as a percentage of the R, value relative to the highest peak see Fig.
Dt bt byte by bey. No part of ISO Handbook 33 may be copied, or taproduced in any form, slectronic retrieval eystem or atherwiee without the prior written consent of the American National Standards Intitute, 11 Weat 42nd Street, New York.
Just as for the average slope Ay. Area methods may be divided into two classes, area profiling methods and area aver- aging methods, as defined below. Ordinarily, the function Zixy is developed by juxtaposing a set of parallel profiles as shown in Fig. The height function Zxy is defined in para. Such techniques include parallel plate capacitance and optical scatering topography — the three-dimensional representation of geometric surface irregularities See Fig.
With 10 jm stylus ra- dius, the instrument may not be suitable for mea- suring very short spatial wavelengts; 4 This type of instrument yields surface param- eter values and generates an output recording of fil- tered or skid-modified profiles.
With a 10 jm stylus radius, these instru- ments may not be suitable for measuring very short spatial wavelengths: c This type of instrument does not generate 2 profile.
It addresses termi- nology, calibration, and use of these instruments for the assessment of individual surface profes, In ad- dition, a description of the Type 1 instrument thet complies with ISO is also included. In cases of disagreement regarding the interpretation of sur- face texture measurements, a Type I instrument in compliance with ISO should be used.
This stylus is traversed over the surface of interest. The displacements ofthe stylus are linearly proportional to the heights of fea- tures contained on the surface, The measured stylus displacements yield the measured surface profile bythe American Society Of Mechanical Engineers 28 3.
The measuring loop com- prises all components which connect the instrument stylus to the workpiece surface. Ideally, the number of com- onents in the measuring loop sould be minimized. The profile co- ordinate system is that right-handed, three-dimen- sional, Cartesian coordinate system defined by the work surface and the direction of motion of the sty- lus.
In this system, the stylus traverse defines the x axis and the displacements normal to the work sur- face define the z axis see Fig. The stylus is the finite object which contacts the workpiece surface to be assessed. The stylus tip is critical in surface profile assessment as it determines the size and shape of surface features which can be properly assessed.
Refer to Section 9 for stylus tip size selec- tion when the short wavelength cutoff is specified. Basic tip geometries are described below.
The ef fective radius 7 of the tip shall be 2, 5, or 10 am 0. A deGanition of ef fective radius is given in Section 4, 3. This profile is not necessarily the actual cross section of the workpiece surface as some surface features of the surface may be inac- cessible for given stylus dimensions.
The pickup comprises the stylus, stylus holding mechanism, measuring transducer, and any signal conditioning associated with the mea- suring transducer. As this system is traversed across the workpiece. When specifying an instrument, the static measuring force is given at the midpoint of the z range of the instrument.
The maximum recommended values of static measuring force are determined by the stylus radius. The dy- amic measuring force is the instantaneous normal force associated with the motion of the stylus as it is traversed relative to the surface. This force may be difficult to quantify and varies both with stylus location on the surface and with the speed of the traverse. The pickup measuring resolution is the smallest z profile height increment detectable by the pickup.
Often, this is a function of the magnification selection and should be reported for each available magnification. The pickup non- linearity is the deviation in z axis magnification as a function of stylus vertical displacement. The drive unit provides x axis range and motion control.
This motion determines the instantaneous x axis positions for corresponding z axis positions. The drive unit also controls the speed of traverse. In a typical application where the stylus measures height displacements in the z direction, the reference guide constrains the drive unit in the y and z directions, 3. The x axis resolu- tion is defined as the smallest increment in the x direction which can be resolved.
The x axis position can be determined either by a velocity-time system or by an encoding system. The external datum is the reference with respect to which stylus displace- ments are measured. This danum may be separate from the reference guide of integral with it, 2.
The amplifier magnifies the sig- nal generated by the pickup. The amplifier gain is the amount of z magnifcation provided by the am- pliSer. This Sec- tion, covering analog to digital conversion, is op- tional for Type I instruments according to the clas- sification scheme of Section 2, which covers both analog and digital instruments. However, this Section covers terminology associated with the digitization and storage of profile data which is a requirement if an instrument is to comply with ISO These values, to- gether with the sampling rate and stylus traverse speed, or x axis encoder reading, make up the digital representation of the traversed profile, This wavelength is computed as twice the x axis spacing of the digital values the sampling interval.
It should be noted that in prac- tical terms, the measured amplinude of a sinusoidal profile at this wavelength may be smaller than its actual amplitude because of the phase difference be- tween the sampled data points and the profile peaks and valleys.
Refer to Section 9 for further informa- tion pertaining to sampling interval. This phenomenon is referred to as aliasing and is depicted in Fig. The antialiasing fil- ter removes wavelengths shorter than the Nyquist wavelength prior to digitization. This eliminates the potential for aliasing. The instrument sinusoidal transmission function describes the percentage of transmitted am- plitude for sine waves of various wavelengths at given tracing speeds as represented in the analog or digital signal prior to filtering.
The in- strument measuring range is the z axis range over which the surface profile heights can be properly as- sessed by the instrument. The instrument measuring resolution is the smallest de tectable z profile height increment. Often, this is a function of the magnification and should be reported for each available magnification. The zero point drift is the recorded change in z reading under conditions where the stylus is held stationary at constant am- bient temperature and where outside mechanical in- Aluences are minimal.
The mean peak spacing S. The sys Up talus sed to pesform the assessment trust be previously measured. Uncoated razor blades have tip widths of approxi- mately 0. The stylus condition may be accurately measured by traversing such a specimen as shown in Fig. Surfaces with very dominant directions will have Stdi values close to zero and if the amplitude sum of all direction are similar, Stdi is close to 1.
The Radial WavelengthSrwis the dominating wavelength found in the radial spectrum. The amplitude sum, b ralong a semicircle with the radius, ris. The anei spectrum is calculated by the following formula:. The Dominating Radial Wavelength, Srwcorresponds to the semicircle with radius, r maxhaving the highest anwi sum, b max: The Radial Wave IndexSrwiis a measure of how dominant the dominating radial wavelength is, and is defined as the average amplitude sum divided by the amplitude sum of the dominating wavelength:.
With this definition Srwi is always between 0 and 1. If there is a very dominating wavelength, B The Mean Half Wavelength, Shwis based on the integrated radial spectrum:.
Shw corresponds to the radius r 0. Having found r 0. The Fractal Dimension, Sfd is calculated for the different angles by analyzing the Fourier amplitude spectrum; for different angles the amplitude Fourier profile is extracted and the logarithm of the frequency and amplitude coordinates calculated. The fractal dimension, D, for each direction is then calculated as.
The reported fractal dimension is the average for all directions. The fractal g If the surface is fractal the Log Log graph should be highly linear, with at negative slope.
For an anisotropic surface the correlation length is in the direction perpendicular to the surface lay. In principle, the texture aspect ratio has a value between 0 and 1. For a surface with a dominant lay, the parameters will tend towards 0. This may be the case for image containing well organized linear structures. Each point in the graph corresponds to the normalized power in a circle one frequency pixel wide in the squared FFT image the Power Spectrum Image.
The calculated RMS ansk between cursors corresponds to the square root of the sum of all pixels in the 2D Power Spectrum Image between two concentric circles each with the radius of the inverse wavelength of the cursors in the IAPSD graph. The Cross Hatch AngleSch is the found angle of a cross hatch pattern typically created in seen in cylinder liners and created by a honing process used to ensure proper lubrication.
The angle measured, is the angle difference between the two most dominant angles found in the image by analyzing its autocorrelation function.
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ANSI B
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